Home > Products > Component and physical-chemical testing > Olympus Microscope MX61
Olympus Microscope MX61
≥1 Piece
- ShenZhen
- T/T Other
- 30 days
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Product Details
Type | Other, Semiconductor/FPD Inspection Microscope | Warranty | negotiate | |
Usage | Research | After-sales Service | negotiate | |
Mobility | Desktop | Number of Cylinder | ≥Three | |
Stereoscopic Effect | Stereoscopic Effect | Kind of Light Source | Ordinary Light | |
Principle of Optics | Differential Interference Contrast Microscope | Magnification | Other, 1.25x-1000x | |
Shape | Ball, Hemisphere | Principle | Optics | |
Transport Package | Wooden box package | Specification | / | |
Trademark | Olympus | Origin | Japan |
Product Description
1. Olympus MX61 microscope, UIS2 optical system (infinite corrected optical system), 12V100W halogen lamp (centered type), bright field/dark field mirror, can be equipped with an additional dichroic mirror set (optional), for conversion use. Built-in electric aperture diaphragm (each objective can be preset, automatically switches when the objective is changed, and automatically opens during dark field observation). Ultra-wide field upright inclined trinocular tube (F.N. 26.5): MX-SWETTR type or U-SWETTR type (MX-SWETTR is the standard configuration for MX61L). Olympus MX61 microscope, ① reflected light bright field method; ② reflected light dark field method; ③ reflected light Nomarski differential interference contrast method; ④ reflected light simple polarized light method; ⑤ reflected light fluorescence method; ⑥ reflected light illumination method (IR); ⑦ transmitted light bright field method; ⑧ transmitted light simple polarized light method. ③/④/⑤ require dedicated dichroic mirror sets. ⑦/⑧ need to be used in conjunction with transmitted light illumination components.
Olympus MX61 microscope, semiconductor/FPD inspection microscope; provides users with high efficiency. MX61 is suitable for samples up to 200mm, while MX61L is suitable for samples up to 300mm. 1. Large stage mounting: can be used for 400*300mm liquid crystal substrates, and full inspection of 300mm wafers (MX61L). High NA transmitted light condenser is adopted, providing sharper images.
Multiple observation methods, multiple illumination methods, and multiple accessories to meet different application requirements.
Transmitted and reflected light illumination can be used simultaneously, greatly improving the observation effect of liquid crystal substrates.
Semiconductor/FPD inspection microscope; providing users with high efficiency.
2. The MX61 is suitable for samples up to 200mm in size, while the MX61L can accommodate samples up to 300mm.
2.1. Large stage equipped: suitable for comprehensive inspection of 400*300mm liquid crystal substrates and 300mm wafers (MX61L).
2.2 High NA transmission light condenser lens is adopted, providing sharper images.
2.3. Multiple observation methods, various lighting methods, and a variety of accessories to meet different application requirements.
Transmission and reflection lighting can be used simultaneously, greatly enhancing the observation effect of liquid crystal substrates.
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